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Combined eddy current and optical flaw detection methods

$ 0.00 - Tech. Paper #P04723 (Member Price)
$ 15.00 - Tech. Paper #P04723 (List Price)
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By Patrick W. Sansieri, Odyssey Technology Corp., USA
This paper describes the merging of the eddy current and infrared optical tests to simultaneously test insulated wire for flaws in both the wire and the insulation. Both methods test at speeds from 5 fpm to more than 5000 fpm; additional outputs are used to mark flaws at suitable speeds, classify flaws by type, and signal the operator when identifying flaws.
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