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Concurrent measurement principle and technology comparisons

Concurrent measurement principle and technology comparisons

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Laser diffraction diameter measurement is now used for fine wire drawing and in die shops. As a two-axis instrument is not able to detect true ovality, Cersa made only single-axis instruments, but ad ...
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$15.00 - Tech. Paper #P04996 (List Price)

$0.00 - Tech. Paper #P04996 (Member Price)

Year published:2004
Weight:0.2500
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By Jean François Fardeau, CERSA-MCI, France
2003
 
Laser diffraction diameter measurement is now used for fine wire drawing and in die shops. As a two-axis instrument is not able to detect true ovality, Cersa made only single-axis instruments, but added complementary accessories: for production, an oscillating support to make sure the measurement is in line with the maximum and minimum diameter, and, for die shops, a specific tool that makes it easy.
  
 
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