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Novel techniques for measurement of residual stress in axial direction of heavily cold-drawn thin-sized steel wires by focused ion beam

$ 0.00 - Tech. Paper #P05409 (Member Price)
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By Bae Jong-Gu and Ban Deok-Young, Kiswire R&D Center; and Yang Y. S. and Park C. G., Pohang University of Science and Technology (POSTECH), South Korea
Residual stress of fine steel wires has been measured by using the dual-beam focused ion beam (FIB) and digital image correlation (DIC). The residual stress was calculated from the measured displacement field before and after the introduction of a slot. The displacement was obtained by the digital correlation analysis of SEM, while the slot was introduced by FIB milling. The experimental procedures were described and the feasibilities were demonstrated in steel wires fabricated with different conditions.
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