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Development of a novel nonintrusive surface inspection system—application to defect detection on enameled wire, cable and optical fiber

$ 0.00 - Tech. Paper #P04752 (Member Price)
$ 15.00 - Tech. Paper #P04752 (List Price)
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By Hatim Abdul Hamid, Frank Brennan and Wojtek Wlodarski, Royal Melbourne Institute of Technology, Australia, and Ethem Erdas, Beta LaserMike, USA
2000
 
New and innovative noncontact surface analysis systems continue to be in demand in the wire and cable industry. To meet ongoing requirements for improved surface quality detection, a new on-line surface analysis system has been developed. The technique used by this system is of particular interest to enameled wire, general wire and cable and optical fiber applications.
  
 
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