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Seam defect detection on HCS wire

Seam defect detection on HCS wire

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The author describes recent advances in the use of rotating eddy current probe assemblies for the in-line inspection of HCS wire and rod. Digital processing at high rotational speeds permits real-tim ...
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$15.00 - Tech. Paper #P04590 (List Price)

$0.00 - Tech. Paper #P04590 (Member Price)

Number of pages:5
Year published:1999
Weight:0.2500
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By Brian Roberts, Advanced Kiffer Systems, USA
1999
 
The author describes recent advances in the use of rotating eddy current probe assemblies for the in-line inspection of HCS wire and rod. Digital processing at high rotational speeds permits real-time analysis and categorization of seam type defects by their location, length and depth. Developments in probe technology and automatic gap compensation significantly enhance performance.
  
 
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